HALL EFFECT MEASUREMENT SYSTEM

HALL EFFECT MEASUREMENT SYSTEM is used to measure the important parameters of Semiconductor Materials such as Carrier Concentration, Mobility, Resistivity, and Hall Coefficient, and so on. These parameters must be grasped and controlled in advance in order to understand the electrical characteristics of semiconductor materials. Therefore, the Hall Effect Measurement System is an indispensable tool for understanding and studying the electrical characteristics of Semiconductor Devices and Semiconductor Materials. The experimental results are automatically calculated by the software, and the Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, Magneto-Resistance, and other parameters can be obtained at the same time.